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? PC3242TB
TEST CIRCUIT
The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.
COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
Type
Value
C1, C2
C3
C4
Chip Capacitor
Chip Capacitor
Feed-through Capacitor
100 pF
1 000 pF
1 000 pF
CAPACITORS FOR THE V CC , INPUT AND OUTPUT PINS
Capacitors of 1 000 pF are recommendable as the bypass capacitor for the V CC pin and the coupling capacitors for
the input and output pins.
The bypass capacitor connected to the V CC pin is used to minimize ground impedance of V CC pin. So, stable bias
can be supplied against V CC fluctuation.
The coupling capacitors, connected to the input and output pins, are used to cut the DC and minimize RF serial
impedance. Their capacitances are therefore selected as lower impedance against a 50 ? load. The capacitors thus
perform as high pass filters, suppressing low frequencies to DC.
Data Sheet PU10803EJ01V0DS
5
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